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- design_for_test Testability is the concern most often voiced by Texas Instruments (TIä ) application specific integrated circuit (ASIC) users. This document is intended to consolidate TI policies into a coherent approach to designing for testability. It is not intended as a specification
文件名称:arcims
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arcims讲座-ArcIMS talks
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arcims讲座.doc
www.dssz.com.txt
www.dssz.com.txt
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