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EBLabV2.5
- flash电子杂志开发指导手册，针对目前flash开发的方案涉及指导-flash e-book test
A
- 測試用LED 交互閃爍 來回交叉跑來跑去 從左到右的閃-Interactive LED flash test ran back and forth from left to right cross flash
SDHC
- 自己写的SDHC卡驱动测试,用Keil C写,并且用串中调试工具读出指定扇区的内容.本程序在4G 金士顿 SDHC卡上测试.-Write your own test drive of SDHC card with Keil C write, and debug tools with string read out the contents of the specified sector of this program in Kingston 4G SDHC card to test.
test-scheme-of-nand-for-bits-flip
- nand flash由于本身的特性会存在位反转的现象，为了研究位反转现象产生的原因，对位反转出现的问题进行解析，所以设计了本方案。-Phenomenon of bits flip，because of Nand flash the nature of itself.In order to study the causes of this phenomenon ，and the scheme is designed
新建文本文档
- 这是一个测试非常抱歉,该死的网站限制字数(this is a test txt. i'm sorry)